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Diffusion length of photoexcited carriers in GaN
Authors:J. Y. Duboz   F. Binet   D. Dolfi   N. Laurent   F. Scholz   J. Off   A. Sohmer   O. Briot  B. Gil
Affiliation:

a Laboratoire Central de Recherches, Thomson-CSF, 91404 Orsay Cedex, France

b Physikalisches Institut, Universität Stuttgart, D-70550 Stuttgart, Germany

c CNRS-GES-Université de Montpellier II, C.C. 074 Place E. Bataillon, 34095 Montpellier Cedex 5, France

Abstract:When additional carriers are introduced in a material with a non uniform concentration, they tend to diffuse on a scale given by their diffusion length. This parameter can be measured by different methods. Depending on the conditions, different values can be found as the recombination mechanisms differ. In this paper, we present the situation in GaN with various experiments including the photocarrier grating method, photoluminescence and the spectral response in photoconductors. We show that the diffusion length varies from 0.1 μm to a few μm depending on experimental conditions. The interpretation is given based on the diffusion equations and on the analysis of the recombinations.
Keywords:Diffusion length   Photoexcited carriers   GaN
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