| 移动通信存储MCP器件的最终测试及其有效解决方案 |
| |
| 引用本文： | 袁池.移动通信存储MCP器件的最终测试及其有效解决方案[J].电子工业专用设备,2006,36(2):43-48. |
| |
| 作者姓名： | 袁池 |
| |
| 作者单位： | 安捷伦科技应用开发中心,上海,200131 |
| |
| 摘 要： | 分析了存储器芯片自动测试设备的一般构架、存储器件MCP最终测试的需求和特点,研究了最终测试成本的影响因素,提出了存储器件最终测试解决方案应达到的标准,进而分析了VERSATEST应用于MCP最终测试的构架优势,并深入研究了突破性关键接口技术——可编程接口矩阵(PIM)。实验表明,该解决方案可实现有效的MCP最终测试、减少测试时间、提高测试并行度,从而降低测试成本。
|
| 关 键 词： | 多芯片封装 自动测试设备 最终测试 |
| 文章编号： | 1004-4507(2006)02-0043-06 |
| 收稿时间： | 01 10 2006 12:00AM |
| 修稿时间： | 2006年1月10日 |
Final Testing of Mobile Memory MCP Devices and its Effective Solution |
| |
| YUAN Chi.Final Testing of Mobile Memory MCP Devices and its Effective Solution[J].Equipment for Electronic Products Marufacturing,2006,36(2):43-48. |
| |
| Authors: | YUAN Chi |
| |
| Affiliation: | Application Development Center, Agilent Technologies, Inc. Shanghai, 200131, China |
| |
| Abstract: | By investigating the common architecture of Automatic Test Equipment (ATE) for memorydevices and the Final Test challenges of memory based Multi-Chip Package (MCP) devices, and byanalyzing the factors affecting HVM testing cost, certain criteria for selecting Final Test Solution aredrawn. The benefit of VERSATEST architecture as a solution for MCP Final Test is further analyzed, andthe key technology solution of Programmable Interface Matrix (PIM) is also investigated. As the experimentresults show, the solution can realize the effective Final Test of MCP, decrease test time and increase theparallelism, and thus reduce the cost of test. |
| |
| Keywords: | Multi-chip package(MCP) Automatic test equipment Final test |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
