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High-speed access to stored data using switched memory decoding
Affiliation:1. Department of Mechanical Engineering, University of Wisconsin-Madison, Madison, WI, 53706 USA;2. Bremer Institut für angewandte Strahltechnik GmbH, Bremen, 28359, Germany;3. X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA;4. University of Bremen, Bremen, 28359, Germany;1. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Chuo-ku, Sagamihara, Kanagawa 252-5210, Japan;2. National Astronomical Observatory of Japan, 2-21-1 Osawa, Mitaka, Tokyo 181-8588, Japan;3. Advanced Medical Instrumentation Unit, Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Kunigami-gun, Okinawa 904-0495, Japan;4. Research center for Nuclear Physics, Osaka-University, 1-1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan;5. Shimafuji Electric Inc., NS building 3F, 6-36-11 Nishi-Kamata, Ota-ku, Tokyo 144-0051, Japan;1. Purdue University, West Lafayette, IN 47907, USA;2. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
Abstract:Microprocessor systems used in realtime instrumentation and control applications must scan and process a large quantity of empirical data at high speed. When sets of data from a number of successive scans must be stored and processed the time involved in accessing the data by normal methods can be unacceptably long. This paper describes the design of a switched memory decoding circuit which allows data of this type to be accessed at high speed. The way in which the circuit is incorporated in a memory management system for this type of application is also considered.
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