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Using Bulk Built-in Current Sensors to Detect Soft Errors |
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| Authors: | E.H. Neto I. Ribeiro M. Vieira G. Wirth F.L. Kastensmidt |
| Affiliation: | Univ. Estadualdo Rio Grande do Sul; |
| Abstract: | Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption |
| Keywords: | |