| 基于光电耦合的耐压绝缘测试系统设计 |
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| 引用本文： | 常莉丽,路翀,可晓海,古丽江.基于光电耦合的耐压绝缘测试系统设计[J].电子设计工程,2014(4):15-18. |
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| 作者姓名： | 常莉丽 路翀 可晓海 古丽江 |
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| 作者单位： | 伊犁师范学院电子与信息工程学院,新疆伊宁835000 |
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| 基金项目： | 新疆自然科学基金资助项目（2009211A10）;伊犁师范学院项目（2011YLYB38） |
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| 摘 要： | 应用集成光电耦合器TLP521-4,设计了一种基于光电耦合的耐压绝缘测试系统,详细说明了光电耦合隔离的耐压绝缘测试系统的设计思路和硬件电路结构.这种基于光电耦合的耐压绝缘测试系统具有抗电磁干扰强、成本低廉的优点,能极大提高测试系统的工作稳定性.
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| 关 键 词： | 耐压绝缘测试 光电耦合 TLP521 单片机 |
Design of pressure insulation test system based on optocouplers |
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| CHANG Li-li,LU Chong,KE Xiao-hai,GU Li-jiang.Design of pressure insulation test system based on optocouplers[J].Electronic Design Engineering,2014(4):15-18. |
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| Authors: | CHANG Li-li LU Chong KE Xiao-hai GU Li-jiang |
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| Affiliation: | (School of Electronic and Information Engineering, YiLi Normal College, Yining 835000, China) |
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| Abstract: | Design a pressure insulation testing system based on opto-coupler used the devoice of integrated optocoupler TLP521-4,Designing idea and the circuit structure of the Design of pressure insulation test system based on photocoupler isolation was described in detail,and the test system has much merits,such as strong anti-electromagnetic interference and inexpensive so that can improve the stability of the test system work greatly. |
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| Keywords: | pressure insulation test optocoupler TLP521-4 microcontroller |
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