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XAFS spectroscopy; fundamental principles and data analysis |
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| Authors: | Koningsberger DC Mojet BL van Dorssen GE Ramaker DE |
| Affiliation: | (1) Department of Inorganic Chemistry and Catalysis, Debye Institute, Utrecht University, PO Box 80083, 3508 TB, Utrecht, The Netherlands;(2) Department of Chemistry and Materials Science Institute, George Washington University, Washington, DC 20052, USA |
| Abstract: | The physical principles of XAFS spectroscopy are given at a sufficiently basic level to enable scientists working in the field of catalysis to critically evaluate articles dealing with XAFS studies on catalytic materials. The described data-analysis methods provide the basic tools for studying the electronic and structural properties of supported metal, metal–oxide or metal–sulfide catalysts. These methods include (a) fitting in R-space, (b) application of the difference file technique and (c) control of the fit procedure with k 1 and k 3 weighting with the help of phase- and amplitude-corrected Fourier transforms. This revised version was published online in June 2006 with corrections to the Cover Date. |
| Keywords: | XAFS physical principles XAFS data analysis fitting in R-space detection of low Z scatterers phase- and amplitude‐ -corrected Fourier transforms difference file technique use of theoretical references |
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