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Gap-tolerant half-disk bubble device margins
Authors:Almasi   G.
Affiliation:IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.;
Abstract:A simple model is presented which allows accurate prediction of bias margins of gap-tolerant half-disk propagation tracks for bubble domains. After this is verified by comparison with experimental margin data, an "isomargin" plot is derived to show how the margin varies as a function ofWandG, whereWis the minimum linewidth andGis the inter-bar gap. The bias margin is shown to decrease along a fairly straight line which goes to zero whenW + Gequals the runout diameter, i.e., whenW+G approx 1.5 W_{s}, where Wsis the bubble stripwidth or average bubble diameter. This agrees with experiment, and means that the minimum resolvable feature for half-disk type patterns must be less than0.75W_{s}, and probably will not be much larger than0.5W_{s}to0.6W_{s}. It is concluded that, if made with perfect Permalloy, T-bars and half-disks should propagate isolated bubbles equally well. The advantages of half-disks over T-bars are 1) the fatal bar-crossing problem of T-bars with multiple bubbles is avoided, 2) the minimum propagation field is lower than for T-bars, and 3) half-disks seem more tolerant of "bad" (e.g., high-coercivity) Permalloy. Also tabulated are the effects on margins of variations in the device parameters of a representative design, as might be encountered in a fabrication process with finite tolerances. A brief discussion of stop-start margins is given in conclusion.
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