| Abstract: | The origin of the increase in residual spectral linewidth during device degradation is experimentally and theoretically clarified in a multiple quantum well (MQW) distributed feedback (DFB) laser. Non-radiative recombination current increases during device degradation and causes 1/f noise to increase. This current 1/f noise is the origin of the increase in the residual spectral linewidth. Through these degradation behaviours, a model showing a correlation between 1/f noise and the semiconductor laser degradation is proposed. |
