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Integration of efforts for the reliability of microelectronic devices
Authors:W Gerling
Abstract:The expected levels of product reliability will no longer be measurable at product qualification. The control of reliability must be completely changed to proactive measures. This requires close customer-vendor relationships in early phases of specification and qualification, basic solutions by robust design and tough manufacturing engineering with zero defect targets. This changing situation is illustrated by some examples in the very diverse field of contributions to reliability. Improved cooperation is required for more efficient reliability progress.
Keywords:Microelectronic device reliability  Building-in reliabiliry  Robust design  Low ppm failure  Defect density  Technology qualification  Audit procedures  Reliability modelling
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