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A Mixed-Mode BIST Scheme Based on Folding Compression
引用本文:梁华国. A Mixed-Mode BIST Scheme Based on Folding Compression[J]. 计算机科学技术学报, 2002, 17(2): 0-0. DOI: 10.1007/BF02962213
作者姓名:梁华国
作者单位:[1]DepartmentofComputerandInformation,HefeiUniversityofTechnology,Hefei230009,P.R.China [2]InstituteofAppliedComputerScience,UniversityofInnsbruck,Austria
摘    要:In this paper a new scheme of mixed mode scan-based BIST is presented with complete fault coverage,and some new concepts of folding set and computing are introduced.This scheme applies single feedback polynomial of LFSR for generation pseudo-random patterns as well as for compressing and extending seeds of folding sets and an LFSR, where we encode seed of folding set as an initial seed of LFSR .Moreover these new techniques are 100% compatible with scan design .Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFRSRs.

关 键 词:混合模式 BIST计划 合并压缩 随机模式测试 集成电路

A mixed-mode BIST scheme based on folding compression
Huaguo Liang,Sybille Hellebrand,Hans-Joachim Wunderlich. A mixed-mode BIST scheme based on folding compression[J]. Journal of Computer Science and Technology, 2002, 17(2): 0-0. DOI: 10.1007/BF02962213
Authors:Huaguo Liang  Sybille Hellebrand  Hans-Joachim Wunderlich
Affiliation:(1) Department of Computer and Information, Hefei University of Technology, 230009 Hefei, P.R. China;(2) Institute of Applied Computer Science, University of Innsbruck, Austria;(3) Institute of Computer Science, University of Stuttgart, Germany
Abstract:In this paper a new scheme for mixed mode scan-based BIST is presented with complete fault coverage, and some new concepts of folding set and computing are introduced. This scheme applies single feedback polynomial of LFSR for generating pseudo-random patterns, as well as for compressing and extending seeds of folding sets and an LFSR, where we encode seed of folding set as an initial seed of LFSR. Moreover these new techniques are 100% compatible with scan design. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs. This work has been supported by the DFG grant Wu 245/1-3 LIANG Huaguo received the BEng and the MEng degrees in computer science and applications in 1982 and 1989, respectively, from Hefei University of Technology, China. From 1982 to 1998 he worked at Hefei University of Technology, where currently he is an associate professor and also head of the Computer Application Division. Since 1998 he has been working as a guest research fellow at the Division of Computer Architecture, University of Stuttgart, Germany. His research interests include built-in self-test, design automation of digital systems ATPG algorithms, and distributed control. Sybille Hellebrand received her diploma in mathematics from the University of Regensburg, Germany in 1986. In 1986 she joined the Institute of Computer Design and Fault Tolerance, University of Karlsruhe, where she received the Ph.D. degree in 1991. Then she was a postdoctoral fellow at the TIMA/IMAG-Computer Architecture Group, Grenoble, France. From 1992 to 1996 she worked as an assistant professor at the University of Siegen, Germany. After a sabbatical stay at Mentor Graphics Corp., Wilsonville, Oregon, she joined the Division of Computer Architecture at the University of Stuttgart, Germany in 1997. Since October 1999 she has been a full professor for Applied Computer Science at University of Innsbruck, Austria. Her main research interests include BIST for high quality applications and synthesis of testable systems. Hans-Joachim Wunderlich received the Dr. rer. nat. (Ph.D.) degree in computer science from the University of Karlsruhe in 1986. There he was head of a research group on automation of circuit design and test from 1986 to 1991. From 1991 to 1996 he was a full professor for computer science at the University of Siegen. Since October 1996 he has been head of the Division for Computer Architecture at the University of Stuttgart. He has been a member of the program committee of numerous conferences and a reviewer of research proposals submitted to NSF and NATO. Within the European projects EUROCHIP and EUROPRACTICE he has been a lecturer for courses on VLSI design and test. Prof. Wunderlich is the author and co-author of three books and over 80 papers in the field of test, synthesis, and fault tolerance of digital systems.
Keywords:BIST  random pattern testing  LFSR  folding set  encoding seed
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