| X荧光光谱法快速测定手机有害元素含量 |
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| 引用本文： | 刘祥军,陈燕舞,杨雅兰,黄思琪,梁木春,叶俊英. X荧光光谱法快速测定手机有害元素含量[J]. 广州化工, 2014, 0(12): 131-132 |
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| 作者姓名： | 刘祥军 陈燕舞 杨雅兰 黄思琪 梁木春 叶俊英 |
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| 作者单位： | 顺德职业技术学院应用化工技术学院,广东佛山528333 |
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| 摘 要： | 采用X荧光光谱仪快速分析20款手机表面的Cr、Cd、Pb、Hg以及Br等多种RoHS限制的有害元素含量。该方法对不同大小,形状,品牌的手机可不做任何的预处理,直接无损测定其表面有害元素。测定结果表明,抽查的20款手机,整体表现优秀,合格率达到95%;方法精密度良好。
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| 关 键 词： | X荧光光谱法 手机 RoHS 有害元素 |
Rapid Determination of Harmful Element Contents in the Mobile-phone by X-ray Fluorescence Spectrometry |
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| LIU Xiang-jun,CHEN Yan-wu,YANG Ya-lan,HUANG Si-qi,LIANG Mu-chun,YE Jun-ying. Rapid Determination of Harmful Element Contents in the Mobile-phone by X-ray Fluorescence Spectrometry[J]. GuangZhou Chemical Industry and Technology, 2014, 0(12): 131-132 |
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| Authors: | LIU Xiang-jun CHEN Yan-wu YANG Ya-lan HUANG Si-qi LIANG Mu-chun YE Jun-ying |
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| Affiliation: | (College of Chemical Technology, Shunde Polytechnic, Guangdong Foshan 528333, China) |
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| Abstract: | Fast analysis of harmful elements in the 20 mobile phone surface , such as Cd, Cr, Pb, Hg and Br, in which RoHS restricted by X -ray fluorescence spectrometry.Without any sample pretreatment , the concentration of harmful elements in samp 1 es with different sizes , shapes and brands can be detected.The determination results showed that spot checks of the 20 mobile phone , qualifiedrate reached 95%, and the precision of the method was good. |
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| Keywords: | X - ray fluorescence spectrometry mobile phone Rolls harmful elements |
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