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Compositional variation of refractive index and absorption edge parameters in Hf1−xTixO2 thin films |
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| Authors: | IP Studenyak OT Nahusko |
| Affiliation: | a Uzhhorod National University, 46 Pidhirna St., Uzhhorod 88000, Ukraine b Geotechnical Department Vara?din, University of Zagreb, 7 Hallerova Aleja, 42000 Vara?din, Croatia c Ru?er Boškovic Institute, 54 Bijeni?ka Cesta, 10000 Zagreb, Croatia |
| Abstract: | Experimental ellipsometric studies of Hf1−xTixO2 thin films were carried out to determine refractive indices as well as spectrometric studies of these films were carried out to determine interferential transmission spectra. The dispersion curves of the refractive indices are well described by the optical-refractometric relation. Compositional dependences of optical pseudogap and refractive indices of Hf1−xTixO2 thin films are investigated. Effect of compositional disordering on the optical absorption edge in Hf1−xTixO2 thin films is studied. |
| Keywords: | 78 40 Ha 78 20 Ci 78 66 Nk |
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