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新型具有低比导通电阻的多超结功率器件结构
引用本文:朱辉,李海鸥,李琦,黄远豪,徐晓宁,赵海亮.新型具有低比导通电阻的多超结功率器件结构[J].半导体学报,2014,35(10):104006-5.
作者姓名:朱辉  李海鸥  李琦  黄远豪  徐晓宁  赵海亮
摘    要:提出一种新型多超结LDMOS功率器件,通过在横向和和纵向P柱区与N柱区之间的相互作用降低器件的导通电阻。在这一结构中,多层超结通过相互反向排列而形成,相比于常规超结的二维耗尽,MSJ由于纵向电场调制的作用形成三维耗尽,并且由于深漏的存在,电流分布更好,在各项条件的作用下,漂移区的掺杂浓度得到了提高,降低了器件导通电阻。底层超结的电场屏蔽效应使得该器件达到电荷平衡,由于衬底辅助耗尽效应效应产生的漏区高电场降低了,在漂移区产生一个均匀分布的电场并且获得高击穿电压。通过数值模拟仿真验证表明:在维持高击穿电压的情况下,长12微米的MSJ功率器件的导通电阻相比于同样大小的常规器件降低了42%。

关 键 词:多超结  3维耗尽  击穿电压  导通电阻  电场屏蔽效应

A novel multiple super junction power device structure with low specific on-resistance
Zhu Hui,Li Haiou,Li Qi,Huang Yuanhao,Xu Xiaoning and Zhao Hailiang.A novel multiple super junction power device structure with low specific on-resistance[J].Chinese Journal of Semiconductors,2014,35(10):104006-5.
Authors:Zhu Hui  Li Haiou  Li Qi  Huang Yuanhao  Xu Xiaoning and Zhao Hailiang
Affiliation:Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China;Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China;Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China;Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China;Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China
Abstract:
Keywords:multiple super junction  3D-depleted  breakdown voltage  specific on-resistance  electric field shielding effect
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