An Analog Circuit for Accurate OCVD Measurements |
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| Authors: | Bellone S. Licciardo G.D. |
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| Affiliation: | Dept. of Inf. & Electr. Eng., Univ. of Salerno, Salerno; |
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| Abstract: | An electronic circuit for making accurate open-circuit voltage decay measurements is presented. The circuit overcomes the main limitations that occur in the standard method when used for carrier lifetime characterization because it realizes the ldquoopen-circuit conditionsrdquo of the device under test with an impedance higher than 100 MOmega and reduces the noise that is inherent in the differential operation of the method. |
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