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Direct Imaging of Space‐Charge Accumulation and Work Function Characteristics of Functional Organic Interfaces
Authors:Pablo F Siles  Mirunalini Devarajulu  Feng Zhu  Oliver G Schmidt
Affiliation:1. Materials Systems for Nanoelectronics, Chemnitz University of Technology, Chemnitz, Germany;2. Institute for Integrative Nanosciences, IFW Dresden, Dresden, Germany;3. Center for Advancing Electronics Dresden (cfAED), TU Dresden, Dresden, Germany;4. Faculty of Mechanical Engineering, Cluster of Excellence MERGE, Chemnitz University of Technology, Chemnitz, Germany
Abstract:The tailoring of organic systems is crucial to further extend the efficiency of charge transfer mechanisms and represents a cornerstone for molecular device technologies. However, this demands control of electrical properties and understanding of the physics behind organic interfaces. Here, a quantitative spatial overview of work function characteristics for phthalocyanine architectures on Au substrates is provided via kelvin probe microscopy. While macroscopic investigations are very informative, the current approach offers a nanoscale spatial rendering of electrical characteristics which is not possible to attain via conventional techniques. Interface dipole is observed due to the formation of charge accumulation layers in thin F16CuPc, F16CoPc, and MnPc films, displaying work functions of 5.7, 6.1, and 5.0 eV, respectively. The imaging and quantification of interface locations with significant surface potential and work function response (<0.33 eV for material thickness <1 nm) show also a dependency on the crystalline state of the organic systems. The work function mapping suggests space‐charge carrier regions of about 4 nm at the organic interface. This reveals rich spatial electric parameters and ambipolar characteristics that may drive electrical performance at device scales, opening a realm of possibilities toward the development of functional organic architectures and its applications.
Keywords:functional organic heterostructures  interface surface potential  nanoscale imaging  scanning kelvin probe microscopy  work function mapping
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