Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry |
| |
| Authors: | Rhee Hyug-Gyo Vorburger Theodore V Lee Jonathan W Fu Joseph |
| |
| Affiliation: | Precision Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8212, USA. hrhee@nist.gov |
| |
| Abstract: | Discrepancies between phase-shifting and white-light interferometry have been observed in step-height and surface roughness measurements. The discrepancies have a strong relation to the roughness average parameter of the surface. The skewing effect, which mainly occurs in the vicinity of peaks, valleys, and edges of the sample, causes this problem in white-light interferometry of step height. For roughness, two possible sources of the discrepancy are considered. |
| |
| Keywords: | |
| 本文献已被 PubMed 等数据库收录！ |
|
