Microwave Dielectric Properties of Aluminum‐Substituted Ba6−3xNd8+2xTi18O54 Ceramics |
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| Authors: | Hetuo Chen Bin Tang Zhe Xiong Shuren Zhang |
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| Affiliation: | 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, People's Republic of China;2. National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, People's Republic of China |
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| Abstract: | According to solid‐state reaction routine, microwave dielectric ceramics of aluminum‐supplanted Ba6?3xNd8+2xTi18O54 (0.5 ≤ x ≤ 0.75) ceramics were synthesized and the effects of composition on microwave dielectric properties were determined. As x value increasing from 0.5 to 0.75, with high‐quality factor values (Q × f > 8000 GHz), both dielectric constant (εr) and temperature coefficient of resonant frequency (τf) dropped. The X‐ray diffraction patterns showed a single phase for all compositions. Typically, the research gained temperature coefficients at resonant frequency around + 10 ppm/°C, while kept high relative permittivity and quality factor value. |
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