| 中国2010上海EXPO门票Inlay规范及测试方法的研究与实践 |
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| 引用本文： | 章曙.中国2010上海EXPO门票Inlay规范及测试方法的研究与实践[J].计算机应用与软件,2011,28(8). |
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| 作者姓名： | 章曙 |
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| 作者单位： | 上海华虹计通智能卡系统有限公司,上海,200051 |
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| 摘 要： | 关于RFID电子标签Inlay标准及其测试方法的发布鲜有报道。通过中国2010年上海世博会门票Inlay的制作经历,阐述了Inlay质量的重要性,研究和提出了RFID电子标签Inlay的一些规范要求和相应的测试方法,并在中国2010年上海世博会门票系统中得到成功应用。
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| 关 键 词： | RFID 电子标签 世博门票 Inlay规范 测试方法 |
STUDY AND PRACTICE ON TICKET Inlay NORMALISATION AND TESTING METHOD FOR EXPO 2010 SHANGHAI CHINA |
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| Zhang Shu.STUDY AND PRACTICE ON TICKET Inlay NORMALISATION AND TESTING METHOD FOR EXPO 2010 SHANGHAI CHINA[J].Computer Applications and Software,2011,28(8). |
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| Authors: | Zhang Shu |
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| Affiliation: | Zhang Shu(Shanghai Huahong Jitong Smart Card System Inc.,Shanghai 200051,China) |
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| Abstract: | Papers about the standard of RFID electronic tag Inlay and its testing method are seldom read so far.In this paper,the importance of Inlay quality is expounded,some normalisation requirements and corresponding testing methods of RFID electronic tag Inlay have been studied and practiced as well,both are based on the tickets making experiences on EXPO 2010 SHANGHAI CHINA,and they have all been successfully applied in the ticket system of the EXPO. |
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| Keywords: | RFID Electronic tag Ticket of EXPO Inlay normalisation Testing method |
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