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In situ investigation of SnAgCu solder alloy microstructure
Authors:Alena Pietriková  Jozef Bednar?íkJuraj ?urišin
Affiliation:a Department of Technologies in Electronics, Faculty of Electrical Engineering and Informatics, Technical University of Kǒsice, Kǒsice, Slovak Republic
b Deutsches Elektronen-Synchrotron (DESY), HASYLAB, Notkestrasse 85, D-22603 Hamburg, Germany
Abstract:In situ X-ray diffraction experiments, using synchrotron radiation, were employed to analyze microstructure evolution of the 96.5Sn3Ag0.5Cu (wt.%)—SAC305 lead-free solder alloy during heating (30-240 °C), isothermal dwell (240 °C) and cooling (240-30 °C). The special emphasis was placed on the study of the melting and solidification processes, explaining formation, distribution and the order of crystallization of the crystal phases (β-Sn, intermetallic compounds) in the solder alloy. Furthermore, thermal expansion behaviour of the main constituent phase β-Sn was analyzed prior to melting and after the consequent solidification.
Keywords:SnAgCu solder alloy  Microstructure  In situ X-ray diffraction  Soldification process  β-Sn thermal expansion coefficient
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