Electron tunneling measurements on TSeF-TCNQ and TTF-TCNQ |
| |
Authors: | V Leo JF Thomas IB Johannsen |
| |
Affiliation: | Physique des Solides, Faculté des Sciences (C.P. 233), Université Libre de Bruxelles, Bd. du Triomphe, B-1050 Brussels Belgium;Physics Laboratory III, Bldg. 309 C, The Technical University of Denmark, DK-2800 Lyngby Denmark |
| |
Abstract: | Using a point contact geometry we realized tunnel junctions between single crystals of TTF-TCNQ, TSeF-TCNQ and an oxidized aluminum plate; we studied the dynamic conductance of these junctions as a function of temperature between 4.2 K and room temperature.Above the transition temperature Tc, i.e., in the metallic regime, dI/dV(V) is remarkably well fitted by a parabolic function, in agreement with theoretical considerations. Below the critical temperature, both with TTF-TCNQ and TSeF-TCNQ we observed a flattering of the dI/dV curves, and thus a clear deviation from the parabola.From the low-temperature results, a more sophisticated fit of the curves enabkes an upper limit value of the Peierls gap in these compounds to be calculated which is in good agreement with known values. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|