首页 | 本学科首页   官方微博 | 高级检索  
     


Performance Evaluation of Inversion Mode and Junctionless Dual-Material Double-Surrounding Gate Si Nanotube MOSFET for 5-nm Gate Length
Authors:Sanjay  Prasad   B.  Vohra  A.
Affiliation:1.Electronic Science Department, Kurukshetra University, 136119, Kurukshetra, Haryana, India
;
Abstract:Semiconductors - In this work, drain current ID for 5-nm gate length with dual-material (DM) double-surrounding gate (DSG) inversion mode (IM) and junctionless (JL) silicon nanotube (SiNT) MOSFET...
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号