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Out-of-plane deformation and pull-in voltage of cantilevers with residual stress gradient: experiment and modelling
Authors:Persano  Anna  Iannacci  Jacopo  Siciliano  Pietro  Quaranta  Fabio
Affiliation:1.IMM-CNR, Institute for Microelectronics and Microsystem-Unit of Lecce, National Council of Research, Via Monteroni, 73100, Lecce, Italy
;2.CMM–FBK, Center for Materials and Microsystems, Fondazione Bruno Kessler, Via Sommarive 18, Povo, 38123, Trento, Italy
;
Abstract:

The out-of-plane deformation and the pull-in voltage of electrostatically actuated cantilevers with a residual stress gradient, is investigated in the length range 100–300 µm. Measured pull-in voltages are compared with calculations, which are obtained using previously proposed analytical expressions and a finite element method (FEM) modelling. In particular, a simplified model of the residual stress distribution inside cantilevers is formulated that enables FEM simulation of measured out-of-plane deformations and pull-in voltages for all lengths of fabricated cantilevers. The presented experimental results and FEM model are exploitable in the design of cantilever-based microelectromechanical systems, in order to provide a reliable prediction of the influence of residual stress gradient on device shape and pull-in voltage.

Keywords:
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