Assessment of the risk imposed by the presence of corroded shallow voids on the initialization and long-term reliability of hard disk drives |
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| Authors: | Srivastava Abhishek O’Dell Tom Boszormenyi Istvan |
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| Affiliation: | 1.Western Digital Corporation, 5601 Great Oaks Parkway, San Jose, CA, USA
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| Abstract: | Microsystem Technologies - This paper investigates how corrosion growth that originates from shallow film voids on thin film sputtered magnetic media can impact the final HDD system performance.... |
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