GigaHertz MUX-DEMUX Chip with HF BIST

Full functional test at speed, in-situ is an ideal choice for use for detection of errors in circuit behaviour for high speed broadband communication circuits and to avoid test set-up disturbances on high frequency signals. This article presents a novel technique to solve the high frequency test of Gbit/s data rate Time-Division Multiplexer/Demultiplexer circuits. This in-situ test technique is based on conventional pseudo-random sequence generation and signature analysis. By linear feedback interconnect and reusable architecture the multiplexer/demultiplexer circuits can operate as generator/analyser with minimal degeneration of bit shift rate. Circuit simulation showed that the system operates correctly with a clock frequency up to 3 GHz in a silicon bipolar technology with a current gain cut-off frequency f _T = 15 GHz.