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Concurrent test method for OTA-C filters
Authors:Kuen-Jong Lee Kou-Shung Huang Wei-Chung Wang
Affiliation:Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan;
Abstract:A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected
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