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A novel microwave method for measuring the complex dielectric constant of polymer thin sheets
Authors:Thirumalizai Bhoopathy  Annamalai Anandavadivel
Affiliation:(1) Post graduate Research Department of Physics, Pachaiyappa's College, Chennai – 600 030, India,;(2) Sri Venkateswara College of Engineering, Sriperumbudur 602 105, India,
Abstract:A new method of measuring the complex dielectric constant of a thin sheet of polymer samples at microwave frequency is presented. In order to obtain the complex dielectric constant in terms of reflection coefficient, a higher order power series solution has been introduced. Application of lower order power series solution to the greater thickness of the sample requires a frequency of less than 1.5 GHz. To overcome this constraint and to extend the range of working frequency, the higher order power series solution is used to obtain the complex dielectric constant. This method is used to measure the complex dielectric constant of poly(ethylene vinyl acetate), polyurethane, polyvinyl acetate, and polystyrene. The results obtained are in good agreement with literature. Electronic Publication
Keywords:Dielectric constant Dielectric loss X-band frequency Polyurethane Polyvinyl acetate Teflon
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