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Characterization of copper-silica catalysts by means ofin Situ diffuse reflectance infrared Fourier transform spectroscopy |
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| Authors: | C. J. G. van der Grift J. W. Geus M. J. Kappers J. H. van der Maas |
| Affiliation: | (1) Department of Inorganic Chemistry, University of Utrecht, Croesestraat 77 A, 3522 AD Utrecht, The Netherlands;(2) Department of Analytical Chemistry, University of Utrecht, Croesestraat 77 A, 3522 AD Utrecht, The Netherlands |
| Abstract: | Copper silica catalyst precursors have been characterized by diffuse reflectance infrared Fourier transform spectroscopy. The measurements were performed both under atmospheric conditions and under controlled gasatmospheres at elevated temperatures. Two reflection bands at 3615 and 690 cm–1 have been attributed to hydroxyl vibrations associated with the presence of copper ions highly dispersed over the silica surface. Calcination of a catalyst precursor at 800 K led to the disappearance of the copper-related surface hydroxyl groups. |
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