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The dielectric properties of glass-ceramic-on-metal substrates for microelectronics packaging
Authors:J. S. Thorp  M. Akhtaruzzaman  E. A. Logan  D. Holland
Affiliation:(1) School of Engineering and Applied Science, University of Durham, Durham, UK;(2) Department of Physics, University of Warwick, Coventry, UK
Abstract:The dielectric properties of some glass-ceramic-on-metal substrates have been determined over the frequency range 500 Hz to 5 MHz using a.c. bridge techniques. The substrates consisted of cordierite-based glass-ceramics screen printed on molybdenum. For glass layers of thickness greater than 100 mgrm both the permittivity, epsiprime and the dielectric loss, epsiPrime, are frequency independent over this frequency range at room temperature giving the value of epsiprime=6.5 and tan delta=8×10–3; the room-temperature data are consistent with the universal law of dielectric response. The variation of permittivity with temperature has also been examined and, below 120 °C, the temperature coefficient [(epsiprime–1) (epsiprime+2)]–1 (partepsiprime/partT)p, was found to be 1.3×10–5 K–1. The results are compared with those previously reported for Al2O3 and AIN substrates.
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