Performance evaluation of the LP test algorithm for finding all solutions of piecewise‐linear resistive circuits

In this letter, the performance of the LP test algorithm, which is an algorithm for finding all solutions of piecewise‐linear resistive circuits, is evaluated by numerical experiments. It is shown that the algorithm could find all solutions of large‐scale problems (including those where the number of variables is 200–300 and the number of linear regions is 10²⁰⁰–10³⁰⁰) in practical computation time. Copyright © 2000 John Wiley & Sons, Ltd.