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Self‐assembled multilayer films based on diazoresins studied by atomic force microscopy/friction force microscopy
Authors:Lan Huang  Guobin Luo  Xinsheng Zhao  Jinyu Chen  Weixiao Cao
Abstract:The layer‐by‐layer self‐assembled NDR‐PSS (nitro‐containing diazoresin‐polysodium p‐styrenesulfonate) films were fabricated. The crosslinking structure formed from the conversion of ionic bond to covalent bond after UV irradiation, confirmed by small angle X‐ray diffraction. The roughness and microtribological properties of NDR‐PSS films were investigated by atomic force microscopy/friction force microscopy. The ordered multilayer films after photoreaction are better in microtribological performance than that of the monolayer film. © 2000 John Wiley & Sons, Inc. J Appl Polym Sci 78: 631–638, 2000
Keywords:self‐assembled nitro‐containing diazoresin‐polysodium p‐styrenesulfonate film  UV irradiation  roughness  microtribological property  atomic force microscopy/friction force microscopy
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