Polarization dependence of EXAFS and XANES spectra of superconducting films on the basis of Y-Ba-Cu-O

Superconducting films of Y-Ba-Cu-O have been studied by EXAFS and XANES spectroscopy. Films of thickness 1000 Å obtained by laser sputtering onto sapphire substrates hadT _c of about 90 K, ΔT _c of about 2 K and the \(\bar c\) axis orientation normal to the substrate surface. The EXAFS and XANES spectra were measured in the region of Y and CuK edges at different orientations of the sample with respect to the polarization vectorē. The spectra were measured in the surface-sensitive total electron yield detection mode. The observed differences between the spectra are discussed and compared with theoretical calculations.