| Si、Na掺杂W基高比重合金液相烧结过程中的界面反应 |
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| 引用本文： | 周国安,刘勇,邓欣,黄继华. Si、Na掺杂W基高比重合金液相烧结过程中的界面反应[J]. 粉末冶金技术, 1999, 17(1): 3-9 |
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| 作者姓名： | 周国安 刘勇 邓欣 黄继华 |
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| 作者单位： | 北京科技大学材料科学与工程学院, 北京 100083 |
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| 基金项目： | 国家自然科学基金!59571023 |
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| 摘 要： | 对不同Si、Na掺杂量的W－（Ni，Fe）高比重合金进行了扫描电镜、透射电镜、X射线光电子能谱（XPS）及俄歇能谱（AES）分析，探讨了Si、Na掺杂在W－（Ni，Fe）及W－W界面所发生的反应，以及此类反应对合金显微结构所产生的影响。研究发现，Si、Na掺杂使合金出现孔隙并在W－（Ni，Fe）界面出现层状SiO2夹杂相，SiO2与液相Ni、Fe的低润湿性以及Na的挥发性是造成这种影响的根本原因。
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| 关 键 词： | 高比重合金 Si Na掺杂 界面反应 |
| 收稿时间： | 1998-05-08 |
INTERFACE REACTIONS IN LIQUID-SINTERING TUNGSTEN HEAVY ALLOY WITH Si, Na IMPURITIES |
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| Zhou Guoan,Liu Yong,Deng Xin et al. INTERFACE REACTIONS IN LIQUID-SINTERING TUNGSTEN HEAVY ALLOY WITH Si, Na IMPURITIES[J]. Powder Metallurgy Technology, 1999, 17(1): 3-9 |
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| Authors: | Zhou Guoan Liu Yong Deng Xin et al |
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| Affiliation: | Department of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083 |
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| Abstract: | SEM,TEM,XPS,and AES are used to analyze heavy alloys with different contents of trace impurities of Si and Na. The reactions caused by Si and Na at the interface of W-(Ni,Fe) and W-W and their effects on the microstructure of heavy alloy are also studied. It is found that the trace impurities of Si and Na result in the formation of pore and layer impurity phase of SiO2 at the interface of W-(Ni, Fe). The low Wettability between SiO2 and Ni,Fe and the volatility of Na during liquid phase sintering are the main reasons for such effect. |
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| Keywords: | heavy alloy Si Na impurities interface reaction |
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