| 漆包线高压漆膜连续性试验仪的研制 |
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| 引用本文： | 王秋光,胡似徽.漆包线高压漆膜连续性试验仪的研制[J].电机与控制学报,1993(1). |
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| 作者姓名： | 王秋光 胡似徽 |
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| 作者单位： | 哈尔滨电工学院电工材料系
(王秋光)，哈尔滨电工学院电工材料系(胡似徽) |
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| 摘 要： | 本文介绍了一种以MCS-51单片机为核心的漆包线高压漆膜连续性试验仪,给出了它的硬件结构和软件设计方法.该试验仪的各项技术指标符合GB4074.20-91标准,为在我国推行漆包线高压漆膜连续性试验方法提供了一种新的装置.
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| 关 键 词： | 漆包线 连续性试验 单片机 试验仪 |
A Study of the Device on Continuity Covering Test under High Voltage for Enamelled Wires |
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| Wang Qiuguang,Hu Sihui Dept. of Electrical Material,HIET.A Study of the Device on Continuity Covering Test under High Voltage for Enamelled Wires[J].Electric Machines and Control,1993(1). |
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| Authors: | Wang Qiuguang Hu Sihui Dept of Electrical Material HIET |
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| Abstract: | The paper described a desiga of the device on continuity covering test under high voltage for enamelled wires, discussed its circuit principle and design method of program. The specifications of the device meet the standard GB4074. 20-91, so it gives a new means to practise continuity covering test under high voltage for enamelled wires method in our country. |
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| Keywords: | enamelled wire continuity covering test single chip processor test device |
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