Charge-Up Scanning Electron Microscopy Images of Intergranular Phases in Semiconducting BaTiO3 Positive Temperature Coefficient of Resistivity Ceramics |
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| Authors: | Hiroshi Nemoto |
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| Affiliation: | R&D Laboratory, NGK Insulators, Ltd., Nagoya 467, Japan |
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| Abstract: | A charge-up image was observed in the intergranular phases of semiconducting BaTiO3 positive temperature coefficient of resistivity (PTCR) ceramics when the ceramic specimens were heated to the Curie temperature in a scanning electron microscope. Experiments showed that this image was caused by intense secondary electron emission localized in the phases. This charge-up state seemed to be closely related to the PTCR mechanism. |
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| Keywords: | barium titanate positive temperature coefficient of resistivity scanning electron microscopy traps second phase |
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