Microstructural parameters in electron‐irradiated hydroxypropyl methylcellulose films using X‐ray line profile analysis |
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| Authors: | Sangappa T. Demappa Mahadevaiah S. Ganesh S. Divakara R. Somashekar |
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| Affiliation: | 1. Department of Studies in Physics, Mangalore University, Mangalagangotri 574 199, India;2. Department of Studies in Polymer Science, Sir M V, P G Center, University of Mysore, Mandya 571 402, India;3. Microtron Center, Mangalore University, Mangalagangotri 574 199, India;4. Department of Physics, East Point College of Engineering and Technology, Bangalore 560 049, India;5. Department of Studies in Physics, University of Mysore, Manasagangotri, Mysore 570006, India |
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| Abstract: | The changes in microstructural parameters in hydroxypropyl methylcellulose (HPMC) polymer films irradiated with 8 MeV electron beam have been studied using wide‐angle X‐ray scattering (WAXS) method. The crystal imperfection parameters such as crystal size <N>, lattice strain (g in %), and enthalpy (α*) have been determined by line profile analysis (LPA) using Fourier method of Warren. Exponential, Lognormal, and Reinhold functions for the column length distributions have been used for the determination of these parameters. The goodness of the fit and the consistency of these results suggest that the exponential distribution gives much better results, even though lognormal distribution has been widely used to estimate the similar stacking faults in metal oxide compounds. © 2008 Wiley Periodicals, Inc. J Appl Polym Sci, 2008 |
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| Keywords: | irradiation WAXS crystal imperfection parameters crystal size |
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