| VXI总线的蠕变测试系统 |
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| 引用本文： | 王耀平 吴小平. VXI总线的蠕变测试系统[J]. 高技术通讯, 1996, 6(6): 10-12 |
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| 作者姓名： | 王耀平 吴小平 |
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| 作者单位： | 北京石油化工学院自动化系 |
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| 摘 要： | 介绍了具有先进ＶＸＩ仪器总线的材料蠕变测试系统。由于设计了为测位移差动变压器初级线圈提供幅度高度稳定的方波信号的方波发生电路以及采用了场效应管从测位移差动变压器输出的方波信号中解调出与位移相应的直流电平，提高了位移测量精度；由于设计了“电位移动”电路，把现场热电偶的电势无损耗地移至测量主机内，保证了温度测量的可靠性，虚拟ＰＩＤ调节器软件使温控设备大大简化。
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| 关 键 词： | 蠕变测量 电子设备 微机 VXI总线 |
The Creep Test System of VXI BUS |
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| Wang Yaorong, Wu Xiaoping. The Creep Test System of VXI BUS[J]. High Technology Letters, 1996, 6(6): 10-12 |
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| Authors: | Wang Yaorong Wu Xiaoping |
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| Affiliation: | (received March 28,1996)Wang Yaorong, Wu Xiaoping (Automation Dept.,Beijing institute of Petro-chem Technolosy,Beijing 102600) |
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| Abstract: | The Paper discusses the test system for material creep with advanced VXI instrument BUS.As the circuit is designed to generate square-wave signal with high-stabilized amplitude to provide the primary coil of the differential transformer for measuring micromotion, and the DC level relative to motion is demodulated from the square-wave signal of the output of the differential transformer by a fieldistor, the precision of motion measurement is enhanced. As the potential move circuit is designed to move the potential of thermocouple into the main-instrument without loss, the reliability of temperature measurement has been raised.The invented PID regulator software has simplified the temperature control device. |
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| Keywords: | Creep measuring Electronic instrument Computer application |
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