Failure diagnosis of structured VLSI |
| |
Authors: | Waicukauski J.A. Lindbloom E. |
| |
Affiliation: | Mentor Graphics Corp., Beaverton, OR; |
| |
Abstract: | The authors describe a method for diagnosing the failures observed in testing VLSI designs that use the scan-path structure. Diagnosis consists of simulating selected faults after testing using a fault simulator that allows the application of several patterns in parallel. The method is also suitable for signature-based random-pattern testing. The authors discuss diagnostic fault simulation, fault-list generation, relating faults to defects, diagnostic strategy, and random-pattern failures, and they report some experimental results to indicate the procedure's power |
| |
Keywords: | |
|
|