Transport Properties of a Tl-2201 Film Close to the Critical Temperature: The Vortex Glass Transition |
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| Authors: | HQ Chen L-G Johansson ZG Ivanov |
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| Affiliation: | (1) Department of Inorganic Chemistry, University of Göteborg, Germany;(2) Department of Microelectronics and Nanoscience, Chalmers University of Technology and University of Göteborg, Germany |
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| Abstract: | We have studied the I-V characteristics of a Tl-2201 film at zero field. In the regime in which flux creep is the dominant dissipation mechanism, the J
c
-T curve is divided into two parts at a temperature T
g
(about 82 K), close to the critical temperature (84 K). The I-V characteristics around T
g
are well described using a flux creep model. For T>T
g
, J
c
/J
c
(0) =0.445x(l-0.525t-0.5t
2
); for T
g
, J
c
/J
c
(0) = 0.9x(1-0.595t-0.44t
2
). Differential resistance (dV/dI) as a function of the measuring current shows a change in curvature close to T
g
. The I-V curves collapsed nicely into two branches by plotting (V/I)/|T–T
g
|
v(z-1)
vs. (I/T)/|T
g
–T|
2v
, indicating a current–reduced vortex glass transition. |
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| Keywords: | |
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