Transport Properties of a Tl-2201 Film Close to the Critical Temperature: The Vortex Glass Transition |
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| Authors: | H.Q. Chen L.-G. Johansson Z.G. Ivanov |
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| Affiliation: | (1) Department of Inorganic Chemistry, University of Göteborg, Germany;(2) Department of Microelectronics and Nanoscience, Chalmers University of Technology and University of Göteborg, Germany |
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| Abstract: | We have studied the I-V characteristics of a Tl-2201 film at zero field. In the regime in which flux creep is the dominant dissipation mechanism, the Jc-T curve is divided into two parts at a temperature Tg(about 82 K), close to the critical temperature (84 K). The I-V characteristics around Tgare well described using a flux creep model. For T>Tg, Jc/Jc(0) =0.445x(l-0.525t-0.5t2); for Tg, Jc/Jc(0) = 0.9x(1-0.595t-0.44t2). Differential resistance (dV/dI) as a function of the measuring current shows a change in curvature close to Tg. The I-V curves collapsed nicely into two branches by plotting (V/I)/|T–Tg|v(z-1)vs. (I/T)/|Tg–T|2v, indicating a current–reduced vortex glass transition. |
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