集成电路分档成品率的效益优化模型及求解

基于对集成电路分层成品率综合效益的考虑，提出了一种新型的效益优化模型．该模型根据客户对产品性能的要求构造了一个综合性能指标函数，把电路的可设计参数、产品分几档、如何分档作为设计参数来建立模型．针对此模型设计了一种算法，这种算法结合有效的抽样技术，在可设计域内均匀抽样，以获得最佳设计值．实验结果表明，通过适当的分档和定价会使集成电路分层成品率效益获得最大．

A novel optimal model of and the solution to the layer yield of IC's

Based on the need for the method to improve the IC's integrated profit, a novel layer yield optimal model is presented. Firstly, an integrated performance function is formulated. Secondly, accoring to the integrated performance function, all factors, such as designable parameters, the number of layers and layered parameters, are considered together to establish the optimal model. Thirdly a special algorithm is designed for this model with efficient sampling technology--Uniform Design. Finally, encouraging results have been obtained thus far, with numerical and circuit examples given to demonstrate the model.