Enhancing encoding capacity of combinational test stimulus decompressors |
| |
| Authors: | ALAWADHI Nader SINANOGLU Ozgur & AL-MULLA Mohammed Computer Science Department Kuwait University Safat Kuwait Computer Engineering Department New York University Abu Dhabi Abu Dhabi PO Box UAE |
| |
| Affiliation: | ALAWADHI Nader 1,SINANOGLU Ozgur 2 & AL-MULLA Mohammed 1 1 Computer Science Department,Kuwait University,Safat 13060,Kuwait 2 Computer Engineering Department,New York University Abu Dhabi,Abu Dhabi PO Box 129188,UAE |
| |
| Abstract: | While scan-based compression is widely utilized in order to alleviate the test time and data volume problems,the overall compression level is dictated not only by the chain to channel ratio but also the ratio of encodable patterns.Aggressively increasing the number of scan chains in an effort to raise the compression levels may reduce the ratio of encodable patterns,degrading the overall compression level.In this paper,we present various methods to improve the ratio of encodable patterns.These methods are b... |
| |
| Keywords: | VLSI test scan-based testing test data compression test pattern encodability add-on blocks |
| 本文献已被 CNKI 维普 等数据库收录！ |
|
