|
|||||
|
|
Variability in nanoscale CMOS technology |
|
| Authors: | KUHN Kelin Portl Technology Development Intel Corporation Hillsboro OR USA |
| Affiliation: | KUHN Kelin Portland Technology Development,Intel Corporation,Hillsboro,OR 97124,USA |
| Abstract: | |
| Keywords: | CMOS variation SRAM Vccmin |
| 本文献已被 CNKI 维普 等数据库收录！ | |