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Prioritizing Test Cases for Memory Leaks in Android Applications
Authors:Ju Qian  Di Zhou
Affiliation:1.College of Computer Science and Technology,Nanjing University of Aeronautics and Astronautics,Nanjing,China;2.State Key Laboratory of Software Engineering,Wuhan University,Wuhan,China;3.Collaborative Innovation Center of Novel Software Technology and Industrialization,Nanjing,China
Abstract:Mobile applications usually can only access limited amount of memory. Improper use of the memory can cause memory leaks, which may lead to performance slowdowns or even cause applications to be unexpectedly killed. Although a large body of research has been devoted into the memory leak diagnosing techniques after leaks have been discovered, it is still challenging to find out the memory leak phenomena at first. Testing is the most widely used technique for failure discovery. However, traditional testing techniques are not directed for the discovery of memory leaks. They may spend lots of time on testing unlikely leaking executions and therefore can be inefficient. To address the problem, we propose a novel approach to prioritize test cases according to their likelihood to cause memory leaks in a given test suite. It firstly builds a prediction model to determine whether each test can potentially lead to memory leaks based on machine learning on selected code features. Then, for each input test case, we partly run it to get its code features and predict its likelihood to cause leaks. The most suspicious test cases will be suggested to run at first in order to reveal memory leak faults as soon as possible. Experimental evaluation on several Android applications shows that our approach is effective.
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