New Measuring Apparatus for Complex Permittivity at Millimeter-Wave Frequencies

A dielectric rod resonator excited by a nonradiative dielectric waveguide is used for measuring complex permittivity of low loss dielectric materials. The complex permittivties of single crystal sapphire, polycrystalline Ba (Mg_1/2 W_1/2) O₃ and Mg₂ Al₄ Si₅ O₁₈ (cordierite) have been obtained at 60 and 77 GHz by the new apparatus. The first time the measurement results of complex permittivity of brain grey and white matters from 15 to 50GHz utilizing a two-port microstrip test fixture is presented. S-parameters of Test fixture are simulated employing the finite-element method. A new spectrometer for the precision measurement of dielectric permittivity and loss tangent, which is capable of providing high resolution data for the first time over an extended W-band (68-118 GHz) frequency for specimens with a large range of absorption values, including highly absorbing specimens that otherwise would not be possible.