基于FPGA及LVDS的大尺寸测量系统设计

目前CCD成像物体尺寸测量系统中存在大物体尺寸测量精度低、抗干扰能力弱、控制复杂且成本高等问题；因此,设计了一种基于FPGA及 LVDS的具有抗干扰能力的大物体尺寸测量系统。该系统通过自扫描光电二极管列阵(SSPD)完成数据采集,经过A/D量化后经由LVDS芯片传输,完成信号噪声的滤除,然后由FPGA调用内部IP核对数据进行缓存,最后将数据传送到上位机进行实时显示。实验结果表明,该系统具有较强抗干扰能力、高速处理能力并且操作简单、成本低,同时实现了对大物体尺寸测量且具有较高精度。

Design of large size measuring system based on FPGA and LVDS

Recently, the large object size measurement system base on CCD has the problem of low measuring precision in large size, bad anti-jamming capability, complex control and high cost. Therefore, this paper designs a large size object measurement system. It has a strong anti-interference ability based on FPGA and LVDS .This system has four steps. First of all, use the self-scanned photodiode array (SSPD) to complete the data collection. Secondly, quantify data with A/D chip. Thirdly, transmit quantified data with LVDS chip to filter noise signal. Fourthly, cache data through IP core in FPGA. Finally, transfer data to PC in real time display. Experimental results show that the system has strong anti-interference ability, high processing capacity, simple operation, low cost and high precision in large size object measurement.