| X-ray Powder Diffraction Pattern of Bi_4(SiO_4)_3 |
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| 摘 要： |
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| 收稿时间： | 1997-03-28 |
X-ray Powder Diffraction Pattern of Bi_4(SiO_4)_3 |
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| Authors: | Hongchao LIU Changlin KUO |
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| Affiliation: | Hongchao LIU,Changlin KUO (Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai,China) |
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| Abstract: | In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F30 is 158.90 (0.0059, 32), intensity figure of merit Rint is 8.7, I20(17), 8.0. The values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail. |
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