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Material characterization of an ion-implantation process for p-type (InGa)As/GaAs quantum-well structures
Authors:D R Myers  E D Jones  I J Fritz  L R Dawson  T E Zipperian  R M Biefeld  M C Smith  J E Schirber
Affiliation:(1) Sandia National Laboratories, Albuquerque, NM
Abstract:We have performed a detailed study of the formation of Be+-implanted contacts to modulation-doped, p-channel, (InGa)As/GaAs, single-strained quantum wells. Photoluminescence at 4 K from these structures is shown to be an excellent monitor of implant and annealing effects, as corroborated by Hall-effect measurements. Rapid thermal annealing produced higher electrical activation of the Be implants than did arsine-over-pressure annealing at comparable temperatures, similar to the trend in bulk GaAs. In contrast to conventional, alloyed-contact technologies, the rapid-annealed, implanted structures provided ohmic contact to the quantum well even at 4 K.
Keywords:InGaAs/GaAs  Be implants  quantum-well structures
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