带时间参数的测试产生

进延测试对于高速集成电路非常重要。本文介绍一个带时间参烽的时延测试产生系统。该系统使用一个时刻逻辑值来表示一个波形，并将输入波形限制为只有唯一的一个输入在０时刻有跳变，其它输入为稳定的０或１，从而实现了波形敏化条件下的时延测试产生，与以往的不考察时间因素的时延测试产生系统相比，带时间参烽的测试产生提高了故障覆盖率，并且更接近于电路的实际。

DELAY TEST GENERATION WITH A TIME PARAMETER

Delay testing is important for high speed ICs. In this paper, a system of delay test generation with a time parameter, called DTGWTP, is introduced to generate test pattern for circuits given normal delay assignment. A time parameter is added in DTGWTP by using a timelogic table for each line in the circuit under test to represent a waveform. The system implements waveform sensitization. The input waveforms are restricted to a single input transition among all inputs at time t=0. DTGWTP is based upon 9-value logic. Adding a time parameter to the test generation makes it possible for the 9-valued logic to be consistent to the binary logic at any time.Furthermore, 3-value logic is used in DTGWTP to accelerate the test generation whenever possible. In comparison to the prior systems that don't take into account time factors,the authors' system with a time parameter reaches a higher fault coverage, more closely to the reality of the circuit.