一种可重配置的存储器测试控制器设计

存储器在SOC中所占的电路面积越来越大，因此存储器的正确与否影响着SOC芯片的成品率。存储器中的故障种类繁多，单一的测试方法不能保证所有故障的100%覆盖率。本文通过对广泛应用的March算法进行了分析，提出了一种可重配置的存储器测试方法。在该方法中通过设置一组控制寄存器就可以灵活的实现各种March算法。另外，采用资源复用的方法，在嵌入式微处理器核中增加了一个有限状态机，几个控制寄存器和几条专门用于存储器测试的指令，可以方便的实现各种March算法，并且硬件开销非常小。

Design of a Reconfigurable Test Controller for Embedded Memory

Based on the analysis of the various widely used March-Algorithm, a configurable March- Algorithm generatoris proposed to realize all March-Algorithm by setting several control registers.Furthermore, a Finite State Machine(FSM) , several control registers, and some new instructions, which are only used to test embedded memories, are addedto the programmable core.A resource sharing architecture is also proposed in this paper.It is shown in this paper thatthe design is easily programmable with a few external controls.Also when combined with the existing functional units inthe programmable core, the hardware overhead is quite small.