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高厚径比值密集盘内孔树脂塞孔研究
引用本文:黄云钟,李金鸿.高厚径比值密集盘内孔树脂塞孔研究[J].印制电路信息,2011(4):72-75.
作者姓名:黄云钟  李金鸿
作者单位:珠海方正科技印刷电路板发展有限公司,广东,珠海,519170
摘    要:设计DOE试验,对高厚径比值密集盘内孔(AR≥1 0,孔心距≤0.80mm)树脂塞孔进行了研究,通过分析确定了塞孔角度是影响树脂塞满度的主要因素,并找到了高厚径比值密集盘内孔树脂塞孔的最佳工艺参数。

关 键 词:高厚径比值  密集盘内孔  树脂塞孔

Study on resin plugging hole of dense VIP with high aspect ratio
Huang Yun-zhong,LI Jin-hong.Study on resin plugging hole of dense VIP with high aspect ratio[J].Printed Circuit Information,2011(4):72-75.
Authors:Huang Yun-zhong  LI Jin-hong
Affiliation:Huang Yun-zhong LI Jin-hong
Abstract:This paper studied on resin plugging hole of dense VIP with high aspect ratio(AR≥10,pitch≤0.80 mm) through DOE.Analysis showed that the angle of plugging hole mainly affected the resin satiation of the hole.Finally,optimum parameters were found out to plug dense VIP with high aspect ratio.
Keywords:high AR  dense VIP  resin plugging hole  
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